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Boundary Scan 测试原理及实现
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&&B​o​u​n​d​a​r​y​ ​S​c​a​n​ ​测​试​原​理​及​实​现
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你可能喜欢&&&&IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Standard Test Access Port and Boundary-Scan Architecture
This standard defines a test access port and boundary-scan architecture for digital integrated circuits and for&br&the digital portions of mixed analog/digital integrated circuits. The facilities defined by the standard seek to&br&provide a solution to the problem of testing assembled printed circuit boards and other products based on&br&highly complex digital integrated circuits and high-density surface-mounting assembly techniques. They&br&also provide a means of accessing and controlling design-for-test features built into the digital integrated circuits&br&themselves. Such features might, for example, include internal scan paths and self-test functions as&br&well as other features intended to support service applications in the assembled product.
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